Do regime de propriedade intelectual : estudos antropológicos /

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Bibliographic Details
Other Authors: Leal, Ondina Fachel (Editor), Souza, Rebeca Hennemann Vergara de (Editor)
Format: Book
Language:Portuguese
Published: Porto Alegre : Tomo Editorial, 2010.
Edition:1a edição.
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Description
Physical Description:288 p. il.
ISBN:9788586225659